Cover of Hayakawa Yu Hayakawa (EDT), Irony Telba Zalkind Irony (EDT), Xie Min Xie (EDT): System And Bayesian Reliability: Essays In Honor Of Professor Richard E Barlow On His 70th Birthday

Hayakawa Yu Hayakawa (EDT), Irony Telba Zalkind Irony (EDT), Xie Min Xie (EDT) System And Bayesian Reliability: Essays In Honor Of Professor Richard E Barlow On His 70th Birthday

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World Scientific Publishing Company

2001

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978-981-4489-34-8

981-4489-34-4

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This volume is a collection of articles on reliability systems and Bayesian reliability analysis. Written by reputable researchers, the articles are self-contained and are linked with literature reviews and new research ideas. The book is dedicated to Emeritus Professor Richard E Barlow, who is well known for his pioneering research on reliability theory and Bayesian reliability analysis.

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