Cover of Ken-ichi Shudo (EDT), Ikufumui Katayama (EDT), Shin-Ya Ohno (EDT): Frontiers in Optical Methods

Ken-ichi Shudo (EDT), Ikufumui Katayama (EDT), Shin-Ya Ohno (EDT) Frontiers in Optical Methods

Nano-Characterization and Coherent Control

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Springer Berlin Heidelberg

2013

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978-3-642-40594-5

3-642-40594-0

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This collection of reviews by leading Japanese researchers covers topics like ultrafast optical responses, terahertz and phonon studies, super-sensitive surface and high-pressure spectroscopy, combination of visible and x-ray photonics. Several related areas at the cutting edge of measurement technology and materials science are included. This book is partly based on well-cited review articles in the Japanese language in special volumes of the Journal of the Vacuum Society of Japan.

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