Cover of Johann M.Ph. Schumann (EDT), Yan Liu (EDT): Applications of Neural Networks in High Assurance Systems

Johann M.Ph. Schumann (EDT), Yan Liu (EDT) Applications of Neural Networks in High Assurance Systems

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Springer Berlin Heidelberg

2010

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978-3-642-10690-3

3-642-10690-0

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"Applications of Neural Networks in High Assurance Systems" is the first book directly addressing a key part of neural network technology: methods used to pass the tough verification and validation (V&V) standards required in many safety-critical applications. The book presents what kinds of evaluation methods have been developed across many sectors, and how to pass the tests. A new adaptive structure of V&V is developed in this book, different from the simple six sigma methods usually used for large-scale systems and different from the theorem-based approach used for simplified component subsystems.

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