Cover of Walter Kropatsch (EDT), Martin Kampel (EDT), Allan Hanbury (EDT): Computer Analysis of Images and Patterns

Walter Kropatsch (EDT), Martin Kampel (EDT), Allan Hanbury (EDT) Computer Analysis of Images and Patterns

12th International Conference, CAIP 2007, Vienna, Austria, August 27-29, 2007, Proceedings

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Springer Berlin Heidelberg

2007

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978-3-540-74272-2

3-540-74272-7

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The refereed proceedings of the 12th International Conference on Computer Analysis of Images and Patterns are presented in this volume. The papers cover motion detection and tracking, medical imaging, biometrics, color, curves and surfaces beyond two dimensions, reading characters, words and lines, image segmentation, shape, image registration and matching, signal decomposition and invariants, and features and classification.

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