G. Schmahl (EDT), D. Rudolph (EDT) X-Ray Microscopy

Proceedings of the International Symposium, Gottingen, Fed. Rep. of Germany, September 14-16, 1983

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E-Book information

Publisher: Springer Berlin Heidelberg

Date: 2013

EAN/ISBN13: 978-3-540-38833-3

ISBN10: 3-540-38833-8

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