Xiao Bai (EDT), Edwin R. Hancock (EDT), Tin Kam Ho (EDT), Richard C. Wilson (EDT), Battista Biggio (EDT), Antonio Robles-Kelly (EDT) Structural, Syntactic, and Statistical Pattern Recognition

Annotation

This book constitutes the proceedings of the Joint IAPR International Workshop on Structural, Syntactic, and Statistical Pattern Recognition, S+SSPR 2018, held in Beijing, China, in August 2018.The 49 papers presented in this volume were carefully reviewed and selected from 75 submissions. They were organized in topical sections named: classification and clustering; deep learning and neurla networks; dissimilarity representations and Gaussian processes; semi and fully supervised learning methods; spatio-temporal pattern recognition and shape analysis; structural matching; multimedia analysis and understanding; and graph-theoretic methods.