Cover of Hiroyuki Fujiwara (EDT), Robert W. Collins (EDT): Spectroscopic Ellipsometry for Photovoltaics

Hiroyuki Fujiwara (EDT), Robert W. Collins (EDT) Spectroscopic Ellipsometry for Photovoltaics

Volume 1: Fundamental Principles and Solar Cell Characterization

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Springer International Publishing

2019

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978-3-319-75377-5

3-319-75377-0

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This book provides a basic understanding of spectroscopic ellipsometry, with a focus on characterization methods of a broad range of solar cell materials/devices, from traditional solar cell materials (Si, CuInGaSe2, and CdTe) to more advanced emerging materials (Cu2ZnSnSe4, organics, and hybrid perovskites), fulfilling a critical need in the photovoltaic community.The book describes optical constants of a variety of semiconductor light absorbers, transparent conductive oxides and metals that are vital for the interpretation of solar cell characteristics and device simulations. It is divided into four parts: fundamental principles of ellipsometry; characterization of solar cell materials/structures; ellipsometry applications including optical simulations of solar cell devices and online monitoring of film processing; and the optical constants of solar cell component layers.

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