Phase Change Memory
Device Physics, Reliability and Applications
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Springer International Publishing
2017
EPub, PDF
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978-3-319-69053-7
3-319-69053-1
Annotation
This book describes the physics of phase change memory devices, starting from basic operation to reliability issues. The book gives a comprehensive overlook of PCM with particular attention to the electrical transport and the phase transition physics between the two states. The book also contains design engineering details on PCM cell architecture, PCM cell arrays (including electrical circuit management), as well as the full spectrum of possible future applications.
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