Cover of Jesus Ariel Carrasco-Ochoa (EDT), Jose Francisco Martinez-Trinidad (EDT), Jose Arturo Olvera-Lopez (EDT): Pattern Recognition

Jesus Ariel Carrasco-Ochoa (EDT), Jose Francisco Martinez-Trinidad (EDT), Jose Arturo Olvera-Lopez (EDT) Pattern Recognition

9th Mexican Conference, MCPR 2017, Huatulco, Mexico, June 21-24, 2017, Proceedings

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Springer International Publishing

2017

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978-3-319-59226-8

3-319-59226-2

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This book constitutes the refereed proceedings of the 9th Mexican Conference on Pattern Recognition, MCPR 2017, held in Huatulco, Mexico, in June 2017. The 29 revised full papers presented were carefully reviewed and selected from 55 submissions. The papers are organized in topical sections on pattern recognition and artificial intelligence techniques, image processing and analysis, robotics and remote sensing, natural language processing and recognition, applications of pattern recognition.

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