Cover of Umberto Celano: Metrology and Physical Mechanisms in New Generation Ionic Devices

Umberto Celano Metrology and Physical Mechanisms in New Generation Ionic Devices

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Springer International Publishing

2016

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978-3-319-39531-9

3-319-39531-9

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This thesis presents the first direct observations of the 3D-shape, size and electrical properties of nanoscale filaments, made possible by a new Scanning Probe Microscopy-based tomography technique referred to as scalpel SPM. Using this innovative technology and nm-scale observations, the author achieves essential insights into the filament formation mechanisms, improves the understanding required for device optimization, and experimentally observes phenomena that had previously been only theoretically proposed. 

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