Cover of Parag K. Lala: Introduction to Logic Circuit Testing

Parag K. Lala Introduction to Logic Circuit Testing

Price for Eshop: 880 Kč (€ 35.2)

VAT 0% included

New

E-book delivered electronically online

E-Book information

Springer International Publishing

2022

PDF
How do I buy e-book?

978-3-031-79785-9

3-031-79785-X

Annotation

An Introduction to Logic Circuit Testing provides a detailed coverage of techniques for test generation and testable design of digital electronic circuits/systems. The material covered in the book should be sufficient for a course, or part of a course, in digital circuit testing for senior-level undergraduate and first-year graduate students in Electrical Engineering and Computer Science. The book will also be a valuable resource for engineers working in the industry. This book has four chapters. Chapter 1 deals with various types of faults that may occur in very large scale integration (VLSI)-based digital circuits. Chapter 2 introduces the major concepts of all test generation techniques such as redundancy, fault coverage, sensitization, and backtracking. Chapter 3 introduces the key concepts of testability, followed by some ad hoc design-for-testability rules that can be used to enhance testability of combinational circuits. Chapter 4 deals with test generation and response evaluation techniques used in BIST (built-in self-test) schemes for VLSI chips. Table of Contents: Introduction / Fault Detection in Logic Circuits / Design for Testability / Built-in Self-Test / References

Ask question

You can ask us about this book and we'll send an answer to your e-mail.