Cover of Yip-Wah Chung (EDT): Micro- and Nanoscale Phenomena in Tribology

Yip-Wah Chung (EDT) Micro- and Nanoscale Phenomena in Tribology

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CRC Press

2011

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978-1-4398-3923-2

1-4398-3923-9

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Drawn from presentations at a recent National Science Foundation Summer Institute on Nanomechanics, Nanomaterials, and Micro/Nanomanufacturing, Micro- and Nanoscale Phenomena in Tribology explores the convergence of the multiple science and engineering disciplines involved in tribology and the connection from the macro to nano world. Written by spe

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