Cover of James G. Blight (EDT), David A. Welch (EDT): Intelligence and the Cuban Missile Crisis

James G. Blight (EDT), David A. Welch (EDT) Intelligence and the Cuban Missile Crisis

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Taylor and Francis

2013

EPub
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248

978-1-135-25781-1

1-135-25781-7

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This is the first study to examine throughly the role of US, Soviet and Cuban Intelligence in the nuclear crisis of 1962 - the closest the world has come to Armageddon.

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