Cover of Rene David: Random Testing of Digital Circuits

Rene David Random Testing of Digital Circuits

Theory and Applications

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CRC Press

2020

EPub
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496

978-1-00-014601-1

1-00-014601-4

Annotation

"Introduces a theory of random testing in digital circuits for the first time and offers practical guidance for the implementation of random pattern generators, signature analyzers design for random testability, and testing results. Contains several new and unpublished results. "

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