Cover of Michael J. LuValle, Bruce G. LeFevre, SirRaman Kannan: Design and Analysis of Accelerated Tests for Mission Critical Reliability

Michael J. LuValle, Bruce G. LeFevre, SirRaman Kannan Design and Analysis of Accelerated Tests for Mission Critical Reliability

Price for Eshop: 1762 Kč (€ 70.5)

VAT 0% included

New

E-book delivered electronically online

E-Book information

CRC Press

2004

PDF
How do I buy e-book?

248

978-0-203-49203-1

0-203-49203-X

Annotation

Early approaches to accelerated testing were based on the assumption that there was a simple acceleration factor that would correspond to a linear scaling of time from the operating stress to the accelerating stress. This corresponds to the simplest physical model of the kinetics governing the underlying degradation, but this simple model does not

Ask question

You can ask us about this book and we'll send an answer to your e-mail.